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Tag: Scanning electron microscope

Engineering Defects at the Nanoscale for Better Electronics
InnovationSemiconductorsTechnology

Engineering Defects at the Nanoscale for Better Electronics

Researchers have developed a groundbreaking method to engineer defects in perovskite oxide thin films with nanoscale precision. This controlled defect engineering could revolutionize electronic and quantum materials design by turning imperfections into functional features.

by Darren HoltOctober 28, 2025November 2, 2025

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